Basit öğe kaydını göster

dc.contributor Graduate Program in Electrical and Electronic Engineering.
dc.contributor.advisor Tansal, Sabih.
dc.contributor.author Sonlu, Yaşar.
dc.date.accessioned 2023-03-16T10:17:27Z
dc.date.available 2023-03-16T10:17:27Z
dc.date.issued 1981.
dc.identifier.other EE 1981 So5
dc.identifier.uri http://digitalarchive.boun.edu.tr/handle/123456789/12763
dc.description.abstract In this thesis, the design of a ROM-RAM programmable digital IC tester by using a microcomputer system has been investigated. The tester is a compact automatic test instrument that interrogates the parametriC and functional performance of a wide variety of digital ICs. However, the hardware design of the microcomputer part of the tesiter is excluded from the study, because of economical considerations. A microcomputer system, which vas constructed beforehand, has been employed.
dc.format.extent 30 cm.
dc.publisher Thesis (M.S.)- Bogazici University. Institute for Graduate Studies in Science and Engineering, 1981.
dc.relation Includes appendices.
dc.relation Includes appendices.
dc.subject.lcsh Digital integrated circuits.
dc.subject.lcsh Integrated circuits.
dc.subject.lcsh Automatic checkout equipment.
dc.title Rom-Ram programmable digital IC tester
dc.format.pages 95 leaves;


Bu öğenin dosyaları

Bu öğe aşağıdaki koleksiyon(lar)da görünmektedir.

Basit öğe kaydını göster

Dijital Arşivde Ara


Göz at

Hesabım