Rom-Ram programmable digital IC tester

dc.contributor	Graduate Program in Electrical and Electronic Engineering.
dc.contributor.advisor	Tansal, Sabih.
dc.contributor.author	Sonlu, Yaşar.
dc.date.accessioned	2023-03-16T10:17:27Z
dc.date.available	2023-03-16T10:17:27Z
dc.date.issued	1981.
dc.identifier.other	EE 1981 So5
dc.identifier.uri	http://digitalarchive.boun.edu.tr/handle/123456789/12763
dc.description.abstract	In this thesis, the design of a ROM-RAM programmable digital IC tester by using a microcomputer system has been investigated. The tester is a compact automatic test instrument that interrogates the parametriC and functional performance of a wide variety of digital ICs. However, the hardware design of the microcomputer part of the tesiter is excluded from the study, because of economical considerations. A microcomputer system, which vas constructed beforehand, has been employed.
dc.format.extent	30 cm.
dc.publisher	Thesis (M.S.)- Bogazici University. Institute for Graduate Studies in Science and Engineering, 1981.
dc.relation	Includes appendices.
dc.relation	Includes appendices.
dc.subject.lcsh	Digital integrated circuits.
dc.subject.lcsh	Integrated circuits.
dc.subject.lcsh	Automatic checkout equipment.
dc.title	Rom-Ram programmable digital IC tester
dc.format.pages	95 leaves;