Abstract:
In this thesis, the design of a ROM-RAM programmable digital IC tester by using a microcomputer system has been investigated. The tester is a compact automatic test instrument that interrogates the parametriC and functional performance of a wide variety of digital ICs. However, the hardware design of the microcomputer part of the tesiter is excluded from the study, because of economical considerations. A microcomputer system, which vas constructed beforehand, has been employed.
