dc.contributor |
Graduate Program in Electrical and Electronic Engineering. |
|
dc.contributor.advisor |
Tansal, Sabih. |
|
dc.contributor.author |
Sonlu, Yaşar. |
|
dc.date.accessioned |
2023-03-16T10:17:27Z |
|
dc.date.available |
2023-03-16T10:17:27Z |
|
dc.date.issued |
1981. |
|
dc.identifier.other |
EE 1981 So5 |
|
dc.identifier.uri |
http://digitalarchive.boun.edu.tr/handle/123456789/12763 |
|
dc.description.abstract |
In this thesis, the design of a ROM-RAM programmable digital IC tester by using a microcomputer system has been investigated. The tester is a compact automatic test instrument that interrogates the parametriC and functional performance of a wide variety of digital ICs. However, the hardware design of the microcomputer part of the tesiter is excluded from the study, because of economical considerations. A microcomputer system, which vas constructed beforehand, has been employed. |
|
dc.format.extent |
30 cm. |
|
dc.publisher |
Thesis (M.S.)- Bogazici University. Institute for Graduate Studies in Science and Engineering, 1981. |
|
dc.relation |
Includes appendices. |
|
dc.relation |
Includes appendices. |
|
dc.subject.lcsh |
Digital integrated circuits. |
|
dc.subject.lcsh |
Integrated circuits. |
|
dc.subject.lcsh |
Automatic checkout equipment. |
|
dc.title |
Rom-Ram programmable digital IC tester |
|
dc.format.pages |
95 leaves; |
|