Browsing by Author "Afacan, Engin."

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  • Aging in CMOS circuits and circuit design robust to aging phenomena 
    Afacan, Engin. (Thesis (M.S.) - Bogazici University. Institute for Graduate Studies in Science and Engineering, 2011., 2011.)
    The subject of aging in CMOS circuits has been examined and some reliability simulations have been run for analog CMOS circuits in order to observe the e ects of this phenomenon on the reliability of CMOS circuits in this ...
  • Analog circuit design automation against process variations and aging phenomena 
    Afacan, Engin. (Thesis (Ph.D.) - Bogazici University. Institute for Graduate Studies in Science and Engineering, 2016., 2016.)
    Reliability of CMOS circuits has become a major concern due to substantially worsening process variations and aging phenomena in deep sub-micron devices. As a result, conventional analog circuit sizing tools have become ...

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